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Centralised Instrumentation and Service Laboratory

Faculty Members
  Name Designation Contact Specialization  
Dr. B. SHANTHIPROFESSORau_shan@yahoo.com
Instrument Technology & Power Electronics
Dr. G. SIVAKUMARASSOCIATE PROFESSORgsk_cisl@yahoo.com
9865609800
Materials Science, Analytical Instrumentation

Deputed to other Government Colleges/Institutions

NameDesignationContactSpecialization
Mr. B. GOBINATHASSISTANT PROFESSORgobinathb1975@gmail.com
9043790966
Material Science

Centralised Instrumentation and Service Laboratory - An Outlook

The Centralised Instrumentation and Service Laboratory (CISL) came into existence during the 5th plan period (1978). This was funded by U.G.C. with an objective to cater to the needs of the researchers to meet the emerging changes and challenges of to-day in the realms of experimental research.

Facilities available as on July-2018

S.NO

NAME OF THE EQUIPMENT / INSTRUMENT

MAKE & MODEL

1

    SCANNING ELECTRON MICROSCOPE (SEM)

    JEOL - JSM 5610LV

2

    SIMULTANEOUS THERMAL ANALYSER

    NETZSCH — STA 449 F3 JUPITER

3

    ATOMIC FORCE MICROSCOPE

    AGILENT — 5500 AFM

4

    UV—VISIBLE SPECTROPHOTOMETER

    SHIMADZU — UV1800

5

    FLOW CYTOMETER - SORTER SYSTEM

    BECTON DICKINSON — FACS Aria III

6

    INDUCTIVELY COUPLED PLASMA — MASS SPECTROMETER (ICP-MS)

    AGILENT — 7700x ICP-MS

7

    LASER SCANNING CONFOCAL MICROSCOPE

    NICKON — Al MP, JAPAN

8

    FLAME PHOTOMETER

    SYSTRONICS — 130, INDIA

9

    CONDUCTIVITY METER

    DEEP VISION- 641

10

    pH METER

    DEEP VISION — 101

11

    MUFFLE FURNACE

    INDFURR

12

    HOT AIR OVEN

    TECHNICO

13

    DIGITAL BALANCE

    SHIMADZU

14

    MAGNETIC STIRRER

    REMI

15

    REFRACTOMETER

    SELACO                      .

16

    CENTRIFUGE

    REMI - R-8C

17

    DOUBLE DISTILLATION WATER STILL

    VENSIL

 

SCANNING ELECTRON MICROSCOPE with EDS
JEOL-JSM-5610LV with INCA EDS
(To study morphological, topographical and compositional information about the surface of the sample)


  Magnification : x 18 to 3 00 000
Accelerating Voltage : 0.5 KV to 30 KV
Max. Specimen Size : 32mm dia x 10 mm (H)
Resolution : 3.0 nm (HV) , 4.5 nm (LV)
Image Modes : Secondary electron image (SEI)
: Backscattered electron image (BEI)
Option : Energy Dispersive Spectra (EDS) - X-ray detector

 

SIMULTANEOUS THERMAL ANALYSER (STA)
NETZSCH - STA 449 F3 JUPITER
(To study the Thermal properties of the sample.)

 

Mode : Thermo Gravimetric (TG)
Differential Thermal Analyser (DTA)
Differential Scanning Calorimetry (DSC)
Temperature range : RT to 1400°C @ 10, 20°C/min
Atmosphere : N2 Gas
Sample holder : Al2O3Crucible
Sample requirement : 50 - 100 mg (Powder)

 

ATOMIC FORCE MICROSCOPE (AFM)

AGILENT-5500 AFM
(It provides 3D profile of the sample in a nanoscale)
Imaging mode : Contact & Non contact mode
Sample size : 1cm x 1cm x 1mm (Thin film/mica slide)
Scanning range
      Large Scanner :i.90 μm X 90 μm X 8 μm
      Small Scanner ii.  9 μm X 9 μm X 2 μm

 

FLOW CYTOMETER - CELL SORTER

BD - FACS ARIA III
(It provides rapid analysis of multiple characteristics of single cells -both qualitative and quantitative)
Source : Lasers (633 nm, 488nm, 375nm)
Processing signals : Forward Scatter, Side Scatter, Fluorescence
Flow cell : Quartz
Sample requirement : Single particle suspension
Sampling range : 120µm to 120 nm
Analysis rate : 50,000 particle/sec

 

INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER

(ICP-MS) - AGILENT – 7700x
((It measures the trace elements (sample) available in the ppb range )
Detection limit : 0.1 ppt
Carrier gas : Helium
Mass Resolution : <0.3 amu to > 0.1 amu
Cleaning solution : 1 to 5% nitric acid
Sample requirement : Liquid 10 - 20ml (filtered through 0.5 µm filter and acidified with ultra pure nitric acid ( 5%))

 

LASER SCANNING CONFOCAL MICROSCOPE

NIKON - A1 PLUS
(To study the morphology of cells and tissues - multiple 2D images at different depths)
LASER Source : 405, 488, 457, 477, 514, 560, 640 nm
Objective : 10x, 20x, 40x, 60x (oil)
Detectors : Standard detector (4 channels), Transmission detector & Spectral detector (32 channels)
Imaging : Normal Confocal & Live cell confocal
Resolution : 4K/4K
Scan speed : 10 frames/second
Sample requirement : Fixed on the glass slide

 

UV-VISIBLE SPECTROPHOTOMETER

SHIMADZU – UV 1800
(It measures the intensity of the light passing through a sample)
Range : 190 - 1100 nm
Sample cell : Quartz (10mm path)
Sample requirement : Liquid (10 ml) & blank
Source : W and D2
Mode : % A, %T.

 

FLAME PHOTOMETER

SYSTRONICS - FP 130
(To determine the concentration of Na, K and Ca of the liquid sample)
Range : 1 to 100 ppm
Sensitivity : 0.1 ppm-1
Flame system : LPG
Element : Na, K & Ca
Sample requirement : 5ml / element

 

DIGITAL CONDUCTIVITY / TDS METER

DEEP VISION – Model 641
To detect the electrical conductivity and total dissolved solids in a solution.
Range Conductivity : 200µs to 1000ms
Range TDS : 200ppm to 1000ppm
Accuracy : ±0.5% FS
Resolution : 0.1µs for conductivity
0.1ppm for TDS
Sample requirement : 50-100ml

 

DIGITAL pH METER

DEEP VISION – Model 101
It measures the pH of the aqueous solution.
pH Range : 0 to 14 pH (0.01 pH)
Volt range : 0 to ±1999mV (1mV)
Temp. range RT to 110 ͦC (0. 1 ͦC)
Sample requirement : 50-100ml

 

MISCELLANEOUS EQUIPMENT

• MUFFLE FURNACE - 900˚C
• HOT AIR OVEN - Temperature controller upto 300°
• DIGITL BALANCE - 0.001 – 220 gms
• MAGNETIC STIRRER - Motorless with Hot Plate
• REFRACTOMETER - Liquid RI
• CENTRIFUGE - 8x5ml tube, 5250 RPM
• DISTILLATION WATER STILL - 1 lit. / hr.

Contact:
THE HEAD/ IN-CHARGE,
CISL, DEPARTMENT OF PHYSICS,
ANNAMALAI UNIVERSITY,
ANNAMALAI NAGAR-608 002. TAMIL NADU - INDIA.
Phone- 04144-238 282 ext. 325
Email:cisl.annamalai@gmail.com

Downloads

REQUISITION FOR ATOMIC FORCE MICROSCOPE (AFM)
REQUISITION FOR CONFOCAL MICROSCOPE
REQUISITION FOR FLOW CYTOMETER - CELL SORTER(FACS ARIA III)
REQUISITION FOR INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER (ICP-MS)
REQUISITION FOR SCANNING ELECTRON MICROSCOPE (SEM)
REQUISITION FOR SIMULTANEOUS THERMAL ANALYSIS (STA)
REQUISITION FOR UV-VISIBLE SPECTROPHOTOMETER