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Centralised Instrumentation and Service Laboratory

Faculty Members
  Name Designation Contact Specialization  
Dr. B. SHANTHIPROFESSORau_shan@yahoo.com
Instrument Technology & Power Electronics
Dr. G. SIVAKUMARASSOCIATE PROFESSORgsk_cisl@yahoo.com
9865609800
Materials Science, Analytical Instrumentation
Mr. B. GOBINATHASSISTANT PROFESSORgobinathb1975@gmail.com
9043790966
Material Science

Centralised Instrumentation and Service Laboratory - An Outlook

The Centralised Instrumentation and Service Laboratory (CISL) came into existence during the 5th plan period (1978). This was funded by U.G.C. with an objective to cater to the needs of the researchers to meet the emerging changes and challenges of to-day in the realms of experimental research.

Facilities available as on July-2013

Sl. No.

Instrument Name

Model

1

Scanning Electron Microscope (SEM) with EDS

JEOL-JSM-5610LV with INCA EDS

2

Simultaneous Thermal Analyser (STA)

NETZSCH - STA 449 F3 JUPITER

3

Atomic Force Microscope (AFM)

AGILENT - 5500 AFM

4

FT-IR Spectrometer

PERKIN ELMER - SPECTRUM RX1

5

UV- VIS Spectrophotometer

SHIMADZU - UV 1800

6

Hot air Oven

Technico

7

Refractometer

Selaco

8

Digital Balance

Shimadzu

9

Double Distillation water Still

Vensil

10

Magnetic Stirrer

REMI

SCANNING ELECTRON MICROSCOPE with EDS (SEM-EDS)
JEOL-JSM-5610LV with INCA EDS


  Magnification : x 18 to 3 00 000
Accelerating Voltage : 0.5 KV to 30 KV
Max. Specimen Size : 32mm dia x 10 mm (H)
Image Modes : SEI & BEI
Option : Elemental analysis

 

SIMULTANEOUS THERMAL ANALYSER (STA)
NETZSCH - STA 449 F3 JUPITER

 

Mode

: TG, DTA / DSC

Temperature range : RT to 1400°C @ 10, 20°C/min
Atmosphere : N2 Gas
Sample holder : Al2O3Crucible
Furnace : Silicon carbide furnace
Sample requirement : 50 - 100 mg (solid)

 

ATOMIC FORCE MICROSCOPE (AFM)

AGILENT-5500 AFM
Imaging mode

: Contact, Non contact mode

Sample size : 1cm x 1cm x 1mm
Scanning range :i.90 μm X 90 μm X 8 μm
ii. 9 μm X 9 μm X 2 μm

 

FT-IR SPECTROMETER
PERKIN ELMER - SPECTRUM RX1

 

Range

: 4000 to 400 cm-1

Sample : Solid (pellet), Liquid (5ml)
Mode : %T, ATR

 

UV-VISIBLE SPECTROPHOTOMETER
SHIMADZU - UV 1800

Range

: 190 - 1100 nm

Sample cell : Quartz (10mm path)
Sample requirement

: Liquid (10 ml) & blank

Source : W and D 2
Mode : % A, %T.

 

MISCELLANEOUS EQUIPMENT

DIGITL BALANCE -0.001 - 220 gms
ABBE’S REFRACTOMETER 

- Liquid RI

MAGNETIC STIRRER

- motor less with Hot Plate

BUNSEN BURNER -with Energy regulator
HOT AIR OVEN

-Temperature controller upto 300°

DISTILLATION WATER STILL

- 1 lit./ hr.

MUFFLE FURNACE - 900°C
MINI ELECTRONIC WORKSHOP : CRO, Digital meters, Logic probe. etc.,
MINI GENERAL WORKSHOP : Drilling machines, Grinders, Planners.

 

CHARGES LEVIED

°

Instrument

Mode & Range

Sample Type

Charges

Scanning Electron Microscope with Energy Dispersive Spectra

SEI & BSI
X 30 - X 3 Lakhs

Solid, Powder, Thin film

SEM - Rs.200
SEM with coating - Rs.250
SEM with EDS- Rs.300
Addl. Image: Rs. 75

Simultaneous Thermal Analyser

TG - DTA, TG - DSC
RT -1400°C

Powder

Rs. 250/hour

Atomic Force Microscope

Contact & Non-Contact Mode

Solid, Powder, Thin film having nano particles

Rs. 1000
Addl. Image: Rs. 750

FT-IR Spectrometer

Transmittance
4000 cm-1 - 400 cm-1

Powder, Liquid

Solid/ Liquid - Rs.50

UV-VIS Spectrophotometer

Absorption
195 nm - 900 nm
Liquid only

Liquid

-

 

Note:
Charges are 2 times for other Educational Institutions
Charges are 3 times for Industries

 

Contact:
THE HEAD/ IN-CHARGE,
CISL, DEPARTMENT OF PHYSICS,
ANNAMALAI UNIVERSITY,
ANNAMALAI NAGAR-608 002. TAMIL NADU - INDIA.
Phone- 04144-238 282 ext. 325
Email:cisl.annamalai@gmail.com

Downloads

REQUISITION FOR SCANNING ELECTRON MICROSCOPE (SEM)
REQUISITION FOR ATOMIC FORCE MICROSCOPE (AFM)
REQUISITION FOR SIMULTANEOUS THERMAL ANALYSIS (STA)