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Centralised Instrumentation and Service Laboratory

Faculty Members
  Name Designation Contact Specialization  
Dr. B. SHANTHIPROFESSOR
(CISL. PHYSICS)
au_shan@yahoo.com
Instrument Technology & Power Electronics
Dr. G. SIVAKUMARPROFESSOR
(CISL. PHYSICS)
gsk_cisl@yahoo.com
9865609800
Materials Science, Analytical Instrumentation

CENTRALISED INSTRUMENTATION AND SERVICE LABORATORY

CISL came into existence during the 5th plan period in 1978 to cater the needs of the researchers to meet the emerging changes and challenges of to-day in the realms of advanced research.

 

FACILITIES AVAILABLE

    i. SCANNING ELECTRON MICROSCOPE with ENERGY DISPERSIVE SPECTROMETER (SEM-EDS)
    ii. LASER SCANNING CONFOCAL MICROSCOPE (LSCM)
    iii. INDUCTIVELY COUPLED PLASMA – MASS SPECTROMETER (ICP - MS)
    iv. FLOW CYTOMETER – FLUORESCENCE ASSISTED CELL SORTER (FACS) v. ATOMIC FORCE MICROSCOPE (AFM)
    vi. SIMULTANEOUS THERMAL ANALYZER (STA)
    vii. UV-VISIBLE SPECTROPHOTOMETER (UV-Vis)
    viii. FLAME PHOTOMETER

MISCELLANEOUS EQUIPMENT

    Digital pH meter, Digital conductivity meter, Muffle furnace, Hot air oven, Digital balance, Magnetic stirrer, Centrifuge, Refractometer and Distillation water still

MEMBERS OF THE STAFF

    Head             : Dr.P.VASANTHARANI
                            Professor and Head
                            Department of Physics
    Professors    : Dr.B.Shanthi (Incharge)
                           : Dr.G.Sivakumar
    Tech. officer : Mr.S.Senthilmurugan
    Asst. tech. officer : Mr.K.Monikandan

 

SCANNING ELECTRON MICROSCOPE with EDS
JEOL-JSM-IT 200 with EDS


  Magnification :                 Up to 3 00 000x
Accelerating Voltage :                 0.5 KV to 30 KV
Max. Specimen Size :                 32mm dia x 10 mm (H)
Resolution :                 3.0 nm (HV) , 4.5 nm (LV)
Image Modes :                 Secondary electron image (SEI)
:                 Backscattered electron image (BEI)
Elemental Analysis   :                 Energy Dispersive Spectra (EDS) - X-ray detector
Sample requirement  :                 Dry sample

To study morphological, topographical (images) and compositional information (elemental) about the surface of the sample.

Contact: Dr.G.Sivakumar
Professor
Mob. : 9865609800
e-mail: cisl.au2019@yahoo.com

 

LASER SCANNING CONFOCAL MICROSCOPE

NIKON - A1 PLUS
Source :                 405, 488, 457, 477, 514, 560, 640 nm
Objective :                 10x, 20x, 40x, 60x (oil)
Detectors :                 Standard detector (4 channels), Transmission detector &                   Spectral detector (32 channels)
Imaging :                 Normal Confocal & Live cell confocal
Resolution :                 4K/4K
Scan speed :                 10 frames/second
Sample requirement :                 Fixed on the glass slideGlass bottom Petri dish or well                    plate

To study the morphology of cells and tissues - multiple 2D images at different depths

Contact: Dr.B.Shanthi
Professor
Mob.: 9486786611
e-mail: cisl.au2019@yahoo.com

 

INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER

(ICP-MS) - AGILENT – 7700x
Detection limit :                     0.1 ppt
Carrier gas :                     Helium
Mass Resolution :                    <0.3 amu to > 0.1 amu
Cleaning solution :                     1 to 5% nitric acid
Sample requirement :                    Liquid 10 - 20ml (filtered through 0.5 µm filter and                      acidified with ultra pure nitric acid ( 5%))

It measures most of the elements in the periodic table with detection limits below the ppb range of the liquid samples.

Contact: Dr.G.Sivakumar
Professor
Mob. : 9865609800
e-mail: cisl.au2019@yahoo.com

 

FLOW CYTOMETER - FLUORESCENCE ASSISTED CELL SORTER (FACS)

BD - FACS ARIA III
Source :                    Lasers (633 nm, 488nm, 375nm)
Processing signals :                    Forward Scatter, Side Scatter, Fluorescence
Flow cell :                    Quartz
Sampling range :                    120µm to 120 nm
Analysis rate :                    50,000 particle/sec
Sample requirement :                    Single particle suspension

This is to count, sort, and profile cells in a heterogeneous fluid mixture. It provides rapid analysis of multiple characteristics of single cells - both qualitative and quantitative,

Contact: Mr.K.Monikandan
Assistant Technical officer
Mob.: 9940724565
e-mail: cisl.au2019@yahoo.com

 

ATOMIC FORCE MICROSCOPE (AFM)

AGILENT-5500 AFM
(It provides 3D profile of the sample in a nanoscale)
Imaging mode :                    Contact & Non contact mode
Sample size :                    1cm x 1cm x 1mm (Thin film/mica slide)
Scanning range
Large Scanner :                   90 μm X 90 μm X 8 μm
Small Scanner :                   9 μm X 9 μm X 2 μm
Sample requirement :                   Dry powder,Thin films, Biological sample

It is capable of measuring nanometer scale images of the sample (topography) with little or no sample preparation as well as measuring 3D image of surfaces.

Contact: Dr.B.Shanthi
Professor
Mob.: 9486786611
e-mail: cisl.au2019@yahoo.com

 

SIMULTANEOUS THERMAL ANALYSER (STA)
NETZSCH - STA 449 F3 JUPITER

 

Mode :                    Thermo Gravimetric (TG)
                     Differential Thermal Analyser (DTA)
                     Differential Scanning Calorimetry (DSC)
Temperature range :                    RT to 1400°C @ 10, 20°C/min
Atmosphere :                    N2 Gas
Sample holder :                    Al2O3Crucible
Sample requirement :                    50 - 100 mg (Powder)

To study the Thermal properties of the sample ie., Decomposition, Melting, Glass Transition, Oxidation, Degree of crystallinity, Purity, Product identification and Energies of transition.

Contact:Mr.S.Senthil Murugan
Technical officer
Mob.: 9965571306
e-mail: cisl.au2019@yahoo.com

 

UV-VISIBLE SPECTROPHOTOMETER

SHIMADZU – UV 1800
Range :                    190 - 1100 nm
Sample cell :                    Quartz (10mm path)
Sample requirement :                    Liquid (10 ml) & blank
Source :                    W and D2
Mode :                     % A, %T.
It is used in analytical applications to determine qualitative (functional groups) or quantitative (concentration) information of substances from its absorptive behavior
Contact:Mr.S.Senthil Murugan
Technical officer
Mob.: 9965571306
e-mail: cisl.au2019@yahoo.com

 

FLAME PHOTOMETER

SYSTRONICS - FP 130
Range :                     1 to 100 ppm
Sensitivity :                     0.1 ppm-1
Flame system :                     LPG
Element :                     Na, K & Ca
Sample requirement :                     5ml / element
To determine the concentration of Na, K and Ca of the liquid sample
Contact: Mr.K.Monikandan
Assistant Technical officer
Mob.: 9940724565
e-mail: cisl.au2019@yahoo.com

 

DIGITAL CONDUCTIVITY / TDS METER

DEEP VISION – Model 641
To detect the electrical conductivity and total dissolved solids in a solution.
Range Conductivity :                    200µs to 1000ms
Range TDS :                    200ppm to 1000ppm
Accuracy :                    ±0.5% FS
Resolution :                    0.1µs for conductivity
                     0.1ppm for TDS
Sample requirement :                    50-100ml

 

DIGITAL pH METER

DEEP VISION – Model 101
It measures the pH of the aqueous solution.
pH Range :                    0 to 14 pH (0.01 pH)
Volt range :                    0 to ±1999mV (1mV)
Temp. range :                   RT to 110 ͦC (0. 1 ͦC)
Sample requirement :                    50-100ml

 

MISCELLANEOUS EQUIPMENT

• MUFFLE FURNACE -                    900˚C
• HOT AIR OVEN -                    Temperature controller upto 300°
• DIGITL BALANCE -                    0.001 – 220 gms
• MAGNETIC STIRRER -                    Motorless with Hot Plate
• REFRACTOMETER -                    Liquid RI
• CENTRIFUGE -                    8x5ml tube, 5250 RPM
• DISTILLATION WATER STILL -                    1 lit. / hr.

Contact:
THE HEAD/ IN-CHARGE,
CISL, DEPARTMENT OF PHYSICS,
ANNAMALAI UNIVERSITY,
ANNAMALAI NAGAR-608 002. TAMIL NADU - INDIA.
Phone- 04144-238 282 ext. 325
Email:cisl.annamalai@gmail.com

Downloads

REQUISITION FOR ATOMIC FORCE MICROSCOPE (AFM)
REQUISITION FOR CONFOCAL MICROSCOPE
REQUISITION FOR FLOW CYTOMETER - CELL SORTER(FACS ARIA III)
REQUISITION FOR INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER (ICP-MS)
REQUISITION FOR SCANNING ELECTRON MICROSCOPE (SEM)
REQUISITION FOR SIMULTANEOUS THERMAL ANALYSIS (STA)
REQUISITION FOR UV-VISIBLE SPECTROPHOTOMETER